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. Author manuscript; available in PMC: 2016 Sep 1.
Published in final edited form as: Proc IEEE Inst Electr Electron Eng. 2015 Sep 1;103(9):1478–1493. doi: 10.1109/JPROC.2015.2461624

Fig. 1.

Fig. 1

IVA for multi-dataset analysis and the two key signal properties available in addition to HOS: sample dependence and dependence among sources within a source component matrix Sn