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. 2015 Oct 26;12(10):13435–13454. doi: 10.3390/ijerph121013435

Figure 1.

Figure 1

Characterization of QDs. (A), (C) and (E) represents the TEM characterization of 2.2 nm CdSe QDs, 2.2 nm CdTe QDs and 3.5 nm CdTe QDs respectively; (B), (D) and (F) depict size distribution by DLS characterization of 2.2 nm CdSe QDs, 2.2 nm CdTe QDs and 3.5 nm CdTe QDs, respectively.