Table 1.
Baseline | Two weeks | |||
---|---|---|---|---|
Sham (n = 8) Mean |
AR (n = 8) Mean |
Sham (n = 8) Mean |
AR (n = 8) Mean |
|
IVSd | 1.54 ± 0.06 | 1.55 ± 0.06 | 1.68 ± 0.03 | 1.85 ± 0.06* |
PWd | 1.99 ± 0.05 | 2.04 ± 0.05 | 1.94 ± 0.04 | 2.13 ± 0.06* |
LVEDD | 8.66 ± 0.08 | 9.08 ± 0.09 | 8.90 ± 0.16 | 10.36 ± 0.23* |
LVESD | 5.16 ± 0.10 | 5.21 ± 0.18 | 5.09 ± 0.21 | 6.05 ± 0.30* |
Strain | −23.11 ± 0.78 | −22.66 ± 1.09 | −23.26 ± 1.02 | −22.52 ± 1.03 |
SR (systolic) | −5.43 ± 0.27 | −5.31 ± 0.30 | −5.33 ± 0.31 | −5.12 ± 0.31 |
SR (diastolic) | 6.41 ± 0.58 | 6.15 ± 0.38 | 4.41 ± 1.45 | 5.25 ± 0.32 |
FS | 0.40 ± 0.01 | 0.43 ± 0.02 | 0.43 ± 0.02 | 0.42 ± 0.02 |
Intraventricular septum thickness in diastole (IVSd), posterior wall thickness in diastole (PWd), left ventricular end–diastolic diameter (LVEDD), left ventricular end–systolic diameter (LVESD), strain rate (SR), fractional shortening (FS). Measurements are given as mean (SEM)
* p < 0.05 (sham vs. AR)