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. 2015 Oct 24;71(Pt 11):1429–1436. doi: 10.1107/S2053230X15019858

Table 3. Diffraction data collection and processing.

Values in parentheses are for the highest resolution shell.

Diffraction source Beamline 22-ID, SER-CAT, APS
Wavelength () 1.000
Temperature (K) 100
Detector Rayonix 300HS high-speed CCD detector
Crystal-to-detector distance (mm) 300
Rotation range per image () 0.5
Total rotation range () 250
Exposure time per image (s) 0.25
Space group C2
a, b, c () 137.24, 68.33, 131.49
, , () 90, 110.5, 90
Mosaicity () 0.6
Resolution range () 50.02.12 (2.162.12)
Total No. of reflections 335480
No. of unique reflections 63465
Completeness (%) 97.7 (80.2)
Multiplicity 5.3 (4.7)
I/(I) 21.2 (3.9)
R merge 0.070 (0.421)
R r.i.m 0.033 (0.210)
Overall B factor from Wilson plot (2) 23.2
CC1/2 0.980 (0.898)

R merge = Inline graphic Inline graphic.

Estimated R r.i.m. = R merge[N/(N 1)]1/2, where N is the data multiplicity.