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. 2015 Oct 12;6:8625. doi: 10.1038/ncomms9625

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Scanning electron micrographs in low (a) and high magnification (c), transmission electron micrograph (b) and selected area electron diffraction (SAED) pattern (d) of as-prepared Co₃O₄ films. Diffraction rings of Co₃O₄ are indexed in the SAED pattern. The scale bars represent 2 μm, 50 nm, 100 nm and 5 nm⁻¹ in panel a,b,c and d respectively.