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. 2015 Nov 6;5:16272. doi: 10.1038/srep16272

Figure 2. Resistivity and carrier concentration of Cu2O films grown at different deposition temperatures in a fixed P(O2) of 10 mTorr.

Figure 2

Inset of the figure shows the optical absorption coefficient as a function of photon energy (=hv) as in equation, αhv = (hv − Eg)1/2. Here, h is Planck’s constant and v is the frequency of the incident photon. Single phase Cu2O film grown at 750 °C was measured by a UV/V is spectrophotometer in a diffuse reflectance mode using an integrating sphere.