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. Author manuscript; available in PMC: 2015 Nov 6.
Published in final edited form as: IEEE Trans Microw Theory Tech. 2014 Nov 20;62(12):3172–3182. doi: 10.1109/tmtt.2014.2366134

TABLE I.

Parameters Used for Model Verification

Parameter Symbol Value
Thickness of metal layer t 0.5 μm
Thickness of substrate h2 1 mm
Relative dielectric constant of substrate ε2 3.75
Length of MUT zone lMUT 0.5 mm
Height of MUT zone hl 50 μm
Dimension of CPW g/w/g 7.2/6/7.2 μm
Dimension of GCPW g/w/g 7.2/6/7.2 μm
Dimension of microstrip line w 6 μm