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. 2015 Oct 26;6:8597. doi: 10.1038/ncomms9597

Figure 4. Electrode material characterization for SG–Si.

Figure 4

(a) XPS survey spectra confirming the elements Si, S, C, N and O, (b) high-resolution XPS spectra of carbon in SG–Si, (c) high-resolution XPS of Si–2p in SG–Si, (d) high-resolution XPS spectra of sulfur in pure SG and (e) high-resolution XPS of sulfur in (1) electrode material made of elemental S, SiNP and PAN, (2) electrode material of (1) after being subjected to SHT, (3) electrode material made of SG, SiNP and PAN and (4) electrode material of (3) after being subjected to SHT. a.u., arbitrary unit.