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. 2015 Oct 29;6:8750. doi: 10.1038/ncomms9750

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Cross-sectional TEM images and corresponding selected area electron diffraction (SAED) patterns of irradiated (a) MgAl₂O₄, (b) MgGa₂O₄ and (c) MgIn₂O₄. In the case of MgAl₂O₄, the SAED pattern of the irradiated layer shows that the material is still fully crystalline. In contrast, the irradiated layer in MgGa₂O₄ is partially amorphized and the most damaged layer in MgIn₂O₄ is completely amorphized after irradiation to the same fluence (600 keV Kr at a fluence of 10²⁰ ions per m² at 100 K).