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. 2015 Oct 31;71(Pt 11):1401–1407. doi: 10.1107/S2056989015020046

Table 3. Experimental details.

  (I) (II)
Crystal data
Chemical formula C24H35ClN4O5 C27H39ClN4O5
M r 495.01 535.07
Crystal system, space group Orthorhombic, P21212 Monoclinic, P21
Temperature (K) 193 168
a, b, c (Å) 18.8408 (7), 20.2263 (8), 6.7923 (3) 6.4341 (7), 20.280 (2), 11.0377 (12)
α, β, γ (°) 90, 90, 90 90, 105.248 (1), 90
V3) 2588.41 (18) 1389.5 (3)
Z 4 2
Radiation type Mo Kα Mo Kα
μ (mm−1) 0.19 0.18
Crystal size (mm) 0.37 × 0.36 × 0.29 0.86 × 0.65 × 0.15
 
Data collection
Diffractometer Siemens Platform/APEXII CCD Siemens Platform/APEXII CCD
Absorption correction Integration (SHELXTL/XPREP; Bruker, 2014) Integration (SHELXTL/XPREP; Bruker, 2014)
T min, T max 0.953, 0.960 0.892, 0.980
No. of measured, independent and observed [I > 2σ(I)] reflections 30342, 5243, 4694 16374, 5627, 5222
R int 0.027 0.024
(sin θ/λ)max−1) 0.623 0.625
 
Refinement
R[F 2 > 2σ(F 2)], wR(F 2), S 0.035, 0.085, 1.03 0.032, 0.082, 1.04
No. of reflections 5243 5627
No. of parameters 333 377
No. of restraints 53 14
H-atom treatment H atoms treated by a mixture of independent and constrained refinement H atoms treated by a mixture of independent and constrained refinement
Δρmax, Δρmin (e Å−3) 0.34, −0.43 0.24, −0.21
Absolute structure Flack (1983); Hooft et al. (2008); 2720 Friedels Flack (1983); Hooft et al. (2008); 2720 Friedels
Absolute structure parameter −0.008 (18) 0.036 (19)

Computer programs: APEX2, SAINT, XPREP and XCIF (Bruker, 2014), SHELXS2014 (Sheldrick, 2008), SHELXL2014 (Sheldrick, 2015), SHELXTL (Sheldrick, 2008), CrystalMaker (CrystalMaker, 1994), and publCIF (Westrip, 2010).