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. 2015 Nov 18;5:16637. doi: 10.1038/srep16637

Figure 4. The micrographs of scanning electron microscope (SEM) for fabricated wing scales with aligned lamellae multilayers.

Figure 4

(a) An overview of the mimicked scale with low magnification. (b) A close-up view of the cross-section of the 11-layer lamellae structure. (c) The cross-sectional view of the 15 layers structure. The top PMMA layer was bent up in the cleaving of the sample. (d) The ridge grating as highlighted by dash-lines.