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. 2015 Jul 28;5:12630. doi: 10.1038/srep12630

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Copyright © 2015, Macmillan Publishers Limited

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An AFM probe indents the sample with a predefined force at each point of the mapped surface. Oscillations of multiple frequencies are simultaneously sent to a piezoscanner that oscillates the sample with amplitudes where z₀ is the initial displacement of the sample (used to develop the sample indentation with the predefined force), ω_i, z_i are the frequencies and amplitudes of each oscillation signal, respectively. The oscillations are detected through the deflection of the AFM probe , where d_i and δ_i are the amplitudes and phase shifts for each frequency, respectively (which found through the Fourier transform of the total deflection signal). The values of the recorded amplitudes and phases are used to calculate the storage and loss moduli as well as other parameters characterizing the sample.

Inline graphic — An AFM probe indents the sample with a predefined force at each point of the mapped surface. Oscillations of multiple frequencies are simultaneously sent to a piezoscanner that oscillates the sample with amplitudes where z₀ is the initial displacement of the sample (used to develop the sample indentation with the predefined force), ω_i, z_i are the frequencies and amplitudes of each oscillation signal, respectively. The oscillations are detected through the deflection of the AFM probe , where d_i and δ_i are the amplitudes and phase shifts for each frequency, respectively (which found through the Fourier transform of the total deflection signal). The values of the recorded amplitudes and phases are used to calculate the storage and loss moduli as well as other parameters characterizing the sample.