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. 2015 May 28;5:10492. doi: 10.1038/srep10492

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Effects of device variations. (a) Experimentally measured analog switching data from 9 memristors during 100 potentiation and 100 depression pulses. The blue line and the error bars represent the average and the standard deviation, respectively. (b) Calculated analog switching behaviors after considering device variations in the model. (c) Results of the principal component analysis without device variability. (d) Result of the principal component analysis with realistic device variability captured by the model.