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. 2015 Nov 20;5:16786. doi: 10.1038/srep16786

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(a) The ideal magnetization profile (grey) at the edge of a patterned ferromagnetic stripe, and the profile considering a lateral scattering of 20 nm (red). (b) Simulation of the ferromagnetic edge shown in a) for the case of lateral ion-scattering. (c) Flux-density variation along the solid line in (b) where = 20 nm, the corresponding variation for = 0 and the experimentally observed flux-density variation are plotted along this line.

Inline graphic — (a) The ideal magnetization profile (grey) at the edge of a patterned ferromagnetic stripe, and the profile considering a lateral scattering of 20 nm (red). (b) Simulation of the ferromagnetic edge shown in a) for the case of lateral ion-scattering. (c) Flux-density variation along the solid line in (b) where = 20 nm, the corresponding variation for = 0 and the experimentally observed flux-density variation are plotted along this line.