Figure 5. Sheet resistance of two transparent double-wall carbon nanotube (DWNT) thin films produced by a scalable draw-down Meyer rod coating technique on 120 μm thick polyethylene terephthalate (PET) substrates, demonstrating the applicability of the permittivity analysis meter on conducting materials.

Data points (circles) are the direct current (DC) sheet resistance measured by four-point probe along the length of the sample. The solid lines are sheet resistance at 10 GHz for a belt speed of 18 cm/s. Uncertainties were computed by error propagation based on uncertainties in the dimensions and voltage signal. The uncertainty in the DC data was approximately the size of the data circle. For the permittivity analysis meter (PAM) data, the shaded region represents the uncertainty.