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. 2015 Nov 27;5:17371. doi: 10.1038/srep17371

Figure 1.

Figure 1

(a,b) SEM images of a Au-coated AAO membrane and a Au mesh-coated silicon wafer, respectively; (c) SEM image of SiNWs; (d) TEM diagram of an individual SiNW; (e) HRTEM diagram of a SiNW; (f) Histogram of the SiNWs diameter distribution, together with a Gaussian fit (solid line) of the measured statistical data.