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. 2015 Nov 26;9:2139–2145. doi: 10.2147/OPTH.S75384

Figure 7.

Figure 7

Automated perimetry in OS.

Abbreviations: OS, left eye; MS, mean sensitivity; MD, mean defect; LV, loss variance; CLV, corrected loss variance; SF, short-term fluctuation; RF, reliability factor; IOP, intraocular pressure; Refr S/C/A, Refraction spheric/cylinder/axis.