Table 2.
Cognitive function | Neuropsychological test | Analyzed test parameters | |
---|---|---|---|
Attention | Alertness | Subtest Alertness of the TAP test battery [60] | RT without sound, RT with sound |
Divided Attention | Subtest Divided Attention of the TAP test battery [60] | RT auditory, RT visual, total errors, total omissions | |
Executive functions | Cognitive flexibility | Subtest Flexibility of the TAP test battery [60] | RT, errors, total performance index |
Inhibitory control | Subtest Go/NoGo of the TAP test battery [60] | RT, total errors, total omissions | |
Memory | Long-term memory | • CVLT [35] • VVM2 [36] subscales “construction 2” and “city map 2” |
Short Delay Free Recall, Long Delay Free Recall, Short Delay Cued Recall, Long Delay Cued Recall, Learning Slope, List A Immediate Free Recall Trial 1–5, Learning Efficiency (List A Trial 5) Subtest “city map” (visuo-spatial memory), Subtest “construction” (verbal memory) |
Short-term memory | • CBTT (subtest of the WMS-R) forward task [61] • Digit Span test (subtest of the WMS-R) forward task [61] • List A Trial 1 of CVLT [35] • List B of CVLT [35] • VVM2 [36] subscales “construction 1” and “city map 1” |
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Working Memory | • CBTT backwards task [36, 61] • Digit Span test (subtest of the WMS-R) backwards task [61] |
CBTT Corsi Block Tapping Test, CVLT California Verbal Learning Test, RT reaction time, TAP Test of Attentional Performance, VVM Visual and Verbal Memory Test, WMS Wechsler Memory Scale. Parallel forms of the memory tests were used to avoid learning effects