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. 2015 Dec 2;10(12):e0143947. doi: 10.1371/journal.pone.0143947

Table 1. Data collection and refinement statistics on the apo and complex structures of TSVZV.

Apo TSVZV (4XSE) TSVZV+dUMP (4XSD) TSVZV+BVDUP (4XSC)
Data Collection
Beamline AS MX1 AS MX1 AS MX1
Wavelength (Å) 0.9537 0.9537 0.9537
Resolution Range (Å) 29.7–3.1 (3.1–3.2) a 30.0–2.9 (2.9–3.0)b 30.0–2.9 (2.9–3.0) b
Space group p32 p32 p32
Unit cell 153.4 Å 153.4 Å 89.2 Å 150.2 Å 150.2 Å 89.2 Å 149.5 Å 149.5 Å 89.0 Å
90.0° 90.0° 120.0° 90.0° 90.0° 120.0° 90.0° 90.0° 120.0°
Total reflections 155476 1195011 94756
Unique reflections 42243 49612 46238
I/I(σ) 8.5 (2.4) a 19.8 (3.9) b 8.1 (1.9) b
Multiplicity 3.7 (3.4) a 5.5 (5.2) b 1.5 (1.5) b
Completeness (%) 99.2 (97.5) a 100.0 (99.9) b 96.2 (95.3) b
Rmerge c (%) 12.7 (47.5) a 6.9 (38.0) b 9.7 (40.3) b
Refinement
Rfactor d (%) 23.8 24.0 19.6
Rfree e (%) 26.8 28.0 23.5
Protein residues 1116 1081 1244
Solvent 0 9 30
Ligands 4 phosphate ions 4 dUMP 4 BVDUP
4 1PE
RMSD bonds (Å) 0.5 0.0045 0.002
RMSD angles (°) 1.134 0.882 0.585
Ramachandran favored (%) 95 96 94.4
Ramachandran allowed (%) 5 4 5.1
Ramachandran outliers (%) 0 0 0.5
Rotamer outliers (%) 4.4 6.4 0.8

a The values in the parentheses are for the highest resolution shell (3.1–3.2 Å).

b The values in the parentheses are for the highest resolution shell (2.9–3.0 Å).

c Rmerge=[hkli|Ii(hkl)I¯(hkl)|][hkliI¯(hkl)]×100, where I i is the ith intensity measurement of reflection hkl, Ī(hkl) is the mean intensity measurement of the symmetry related or replicated reflections of the unique reflection hkl.

d Rfactor=[hkl|Fobs(hkl)Fcalc(hkl)|][hklFobs(hkl)]×100, where F obs and F calc are the observed and calculated structure factors respectively.

e Rfree is equivalent to Rfactor but 5% of the measured reflections have been excluded from refinement and set aside for cross validation.