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. 2015 Dec 7;5:17716. doi: 10.1038/srep17716

Figure 5.

Figure 5

Transmission electron microscope (TEM) images of AgNW thin films before electron beam (a) and after electron beam (e), and selected area electron diffraction (SAED) of AgNW thin films before electron beam (b–d) and after electron beam (f–h).