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. 2015 Dec 9;5:17998. doi: 10.1038/srep17998

Figure 3. Scanning electron microscopy analysis (SEM).

Figure 3

(A) - SEM analysis of the interaction between T. harzianum wild type (T) strains. 1 – T. harzianum wild type dual culture plate. 2 – SEM analysis of T. harzianum wild type strains interaction. 2.5 kV acceleration voltage, magnification 250×. 3 – SEM analysis of T. harzianum wild type strains. 2.5 kV acceleration voltage, magnification 500×. (B) - SEM analysis of the interaction between T. harzianum wild type (T) and T. harzianum ∆epl-1 (∆epl-1) strains. 1 – T. harzianum wild type and mutant ∆epl-1 strains dual culture plate. 2 – SEM analysis of T. harzianum wild type and mutant ∆epl-1 interaction. 30 kV acceleration voltage, magnification 350×. 3 – SEM analysis of T. harzianum wild type and mutant ∆epl-1 interaction. 30 kV acceleration voltage, magnification 500×. (C) - SEM analysis of the interaction between T. harzianum RecEpl-1-GFP strains (RecEpl-1-GFP). 1 – T. harzianum RecEpl-1-GFP strains dual culture plate. 2 – SEM analysis of T. harzianum RecEpl-1-GFP strains interaction. 30 kV acceleration voltage, magnification 350×. 3 – SEM analysis of T. harzianum RecEpl-1-GFP strains interaction. 30 kV acceleration voltage, magnification 500×.