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. 2015 Dec 10;5:17929. doi: 10.1038/srep17929

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Copyright © 2015, Macmillan Publishers Limited

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Panel (a) reports the OV fluence profile for E₀ = 29 μJ and w₀ = 46 μm (dashed curve) and the corresponding distribution of the effective fluence for N = 100 (solid curve). Panels (b,c) show the spatial profiles of the electron density N_e and real part of the dielectric permittivity Re[ε] predicted by two-temperature model and free-carrier number density equations, respectively. Panel (d) reports a SEM image of the target surface after an irradiation sequence of N = 100 laser pulses at E₀ = 29 μJ. The circles and color stripes marks the distinct regions with ripples and grooves.