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. 2015 Dec 9;6:10143. doi: 10.1038/ncomms10143

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(a) TEM images represent the dynamic process of the planar slip of undissociated type dislocations; their motion was observed to be slow and quite difficult (shown in real time in Supplementary Movie 3), in contrast to the easy motion of the type partials (shown in Fig. 1). Scale bar, 200 nm. (b) A bright-field TEM image showing the blocking of partial dislocations by the localized band of planar slip (scale bar, 500 nm). As shown in Supplementary Movie 4, partial dislocations move fast but can be abruptly arrested at the localized bands of planar slip containing arrays of many closely packed perfect dislocations. The strong interaction between them provides a significant hardening effect.

Inline graphic — (a) TEM images represent the dynamic process of the planar slip of undissociated type dislocations; their motion was observed to be slow and quite difficult (shown in real time in Supplementary Movie 3), in contrast to the easy motion of the type partials (shown in Fig. 1). Scale bar, 200 nm. (b) A bright-field TEM image showing the blocking of partial dislocations by the localized band of planar slip (scale bar, 500 nm). As shown in Supplementary Movie 4, partial dislocations move fast but can be abruptly arrested at the localized bands of planar slip containing arrays of many closely packed perfect dislocations. The strong interaction between them provides a significant hardening effect.