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. Author manuscript; available in PMC: 2016 Sep 22.
Published in final edited form as: ACS Nano. 2015 Jul 29;9(9):9357–9372. doi: 10.1021/acsnano.5b03443

Figure 4. Physicochemical characterization of doped fumed silica nanoparticles.

Figure 4

Energy-dispersive X-ray spectroscopy (EDX) analysis shows the incremental doping of (A) Ti and (B) Al in fumed silica. The silanol concentration of (A) Ti- and (B) Al-doped fumed silica nanoparticles was calculated through the integration of the FTIR bands at 4500 cm−1 (total silanol). (C) X-ray photoelectron spectroscopy (XPS) analysis showing the surface dopant to silica ratio of Ti- and Al-doped fumed silica nanoparticles.