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. 2016 Jan 1;3(Pt 1):71–83. doi: 10.1107/S2052252515019727

Figure 1.

Figure 1

General schematics of (a) a TEM and (b) a STEM instrument. (a) A plane wave illuminates the object, after which an image is formed using a set of electromagnetic lenses. (b) An electron beam with convergence angle α is scattered by the specimen and collected by an annular detector with inner and outer angles β1 and β2, respectively.