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. 2016 Jan 8;12(1):e1004109. doi: 10.1371/journal.pcbi.1004109

Fig 13. Values of θimpact across the array constrain possible head configurations relative to the surface.

Fig 13

A. A grey dot is placed at each distance-pitch-yaw configuration associated with a unique pattern of θimpact across the array. Approximately 37% of the configurations can be uniquely determined if the values of θimpact are known to within 5°. Note the non-unique region at distances less than 5mm. B. The value of θimpact averaged within each row for different distance and pitch configurations (yaw = 0°). C. The value of θimpact averaged within each column for the same configurations as in B (yaw = 0°).