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. Author manuscript; available in PMC: 2016 Oct 14.
Published in final edited form as: Adv Mater. 2015 Jun 18;27(38):5638–5663. doi: 10.1002/adma.201501015

Figure 6.

Figure 6

A comparison between the lateral and depth resolution of focused STEM beams for: a) an uncorrected 200 kV FEI Tecnai STEM and b) an aberration-corrected 300 kV FEI Titan. The intensity scale shows low intensity for blue and high intensity for red. The drastically reduced probe dimensions (both lateral and depth) of aberration-corrected STEM have important implications for electron tomography because the entire object may not be in focus.