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. Author manuscript; available in PMC: 2016 Oct 14.
Published in final edited form as: Adv Mater. 2015 Jun 18;27(38):5638–5663. doi: 10.1002/adma.201501015

Figure 9.

Figure 9

Concepts of Fresnel contrast in Lorentz (field-free) microscopy. The diagram on the left shows the paths of electrons passing through grains of a magnetic material with opposing in-plane magnetization. The paths bend according to the direction of the magnetic field yielding bright and dark contrast at domain walls. The image intensities in a series of defocused images at a) under-focus, b) over-focus and c) in-focus can be used to estimate d) the electron wave phase shifts due to the magnetic field of the sample. These relative phase shifts can be related to the magnetic properties of the object. Adapted with permission.[130] Copyright 2014, Elsevier.