Fractional changes in (a) PZT, (b) Bi, and (c) BFO lattice spacings Δd∕d
measured with the 003, 222, and 220 reflections, respectively, collected in the
short-pulse, low-α mode. The inset to (a) shows streak camera data measuring the x-ray
pulse duration in the low-α mode. The BFO and PZT samples were pumped with an absorbed
fluence of 25 μJ/cm2 of 343 nm light and the Bi sample with
75 μJ/cm2 of 515 nm light. The red dashed line is a fit to
an error function for all three samples.