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. 2014 May 6;1(3):034301. doi: 10.1063/1.4875347

FIG. 4.

FIG. 4.

Fractional changes in (a) PZT, (b) Bi, and (c) BFO lattice spacings Δd∕d measured with the 003, 222, and 220 reflections, respectively, collected in the short-pulse, low-α mode. The inset to (a) shows streak camera data measuring the x-ray pulse duration in the low-α mode. The BFO and PZT samples were pumped with an absorbed fluence of 25 μJ/cm2 of 343 nm light and the Bi sample with 75 μJ/cm2 of 515 nm light. The red dashed line is a fit to an error function for all three samples.