TABLE III.

Numbers of reflections recorded in diffraction snapshots of MbCO crystals, grouped by resolution, and Z_I cutoff. Z_I = I/σ(I), with I and σ(I) recorded spot intensities and their estimated standard errors, respectively. Only reflections observed and indexed with XDS are counted, irrespective of the delay time (including controls) and the degree of partiality.

Resolution (Å)		Uniques possible	ON images			OFF images			ON and OFF
d.max	d.min	N	ZI > 3	ZI > 5	ZI > 10	ZI > 3	ZI > 5	ZI > 10	ZI > 3	ZI > 5	ZI > 10
19.77	3.44	2976	1706	1289	774	1268	879	438	1199	827	418
3.44	2.72	2975	688	403	182	416	197	62	389	185	61
2.72	2.38	2976	290	138	42	125	47	10	114	44	9
2.38	2.16	2975	142	64	13	43	14	2	37	14	2
2.16	2.00	2975	42	15	3	10	1	0	8	1	0
19.77	2.00	14 877	2868	1909	1014	1862	1138	512	1747	1071	490