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. 2016 Jan 22;6:19624. doi: 10.1038/srep19624

Figure 3. Microscopic Imaging.

Figure 3

(a) Optical microscopic images of mono- to multilayer WTe2 on a Si substrate with a 300 nm SiO2 layer. (b) AFM image of the area (20 × 20 μm2) surrounded by a green dashed line in (a). (c) Height of the flake as a function of the layer number.