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. 2016 Jan 20;6:19621. doi: 10.1038/srep19621

Figure 2. XRD θ−2θ scans of (a) VO2(B), (b) VO2(A) and (c) VO2(M1) thin films on STO (001), (011) and (111) substrates, respectively. The inset in (c) shows XRD scans of the VO2(R) phase (red line) obtained at 100 °C by heating the VO2(M1) film (blue line), which is above the Tc = 68 °C. From φ scans shown in (d) VO2(B), (e) VO2(A) and (f) VO2(M1) and VO2(R) thin films, in-plane lattice matching is schematically illustrated as shown in (g–i).

Figure 2