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. 2016 Feb 5;6:20474. doi: 10.1038/srep20474

Figure 2. Device Fabrication.

Figure 2

(a,b) False colors scanning electron microscope (SEM) images of the top-gated FETs in sample A (a) and sample B (b), respectively. (c,d) False colors SEM images of the patterned bow-tie antennas in sample A (rA = 0.5 mm) and sample B (rB = 0.25 mm), respectively.