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. 2016 Feb 4;7:10452. doi: 10.1038/ncomms10452

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(a,b) Sketches of the experimental configurations used to record the longitudinal spin Seebeck effect (SSE). Three different samples were investigated: Sample A and sample B consist of a GdIG(100 nm)/Pt(8 nm) and a GdIG(1 μm)/Pt(10 nm) bilayer fabricated on a (100)- and a (111)-oriented gadolinium gallium garnet (Gd₃Ga₅O₁₂, GGG) substrate, respectively. Sample C is composed of a GdIG(26 nm)/Pt(10 nm) bilayer fabricated on a (111)-oriented yttrium aluminium garnet (Y₃Al₅O₁₂, YAG) substrate. For sample A and B, the longitudinal SSE signal is determined by measuring the transverse voltage V_t perpendicular to an external magnetic field while modifying the magnetic field magnitude at a fixed magnetic field orientation . The temperature gradient required for SSE measurements is generated by two independently heated copper blocks or AlN ceramics, respectively. The longitudinal SSE signal of sample C is obtained by recording V_t as a function of the in-plane orientation of the external magnetic field α at a fixed magnetic field magnitude of 2 T. Here the temperature gradient across the GdIG/Pt interface is generated by driving a large current I_d along the Pt microstructure. The temperature-dependent resistance of the Pt is exploited for on-chip thermometry.

Inline graphic — (a,b) Sketches of the experimental configurations used to record the longitudinal spin Seebeck effect (SSE). Three different samples were investigated: Sample A and sample B consist of a GdIG(100 nm)/Pt(8 nm) and a GdIG(1 μm)/Pt(10 nm) bilayer fabricated on a (100)- and a (111)-oriented gadolinium gallium garnet (Gd₃Ga₅O₁₂, GGG) substrate, respectively. Sample C is composed of a GdIG(26 nm)/Pt(10 nm) bilayer fabricated on a (111)-oriented yttrium aluminium garnet (Y₃Al₅O₁₂, YAG) substrate. For sample A and B, the longitudinal SSE signal is determined by measuring the transverse voltage V_t perpendicular to an external magnetic field while modifying the magnetic field magnitude at a fixed magnetic field orientation . The temperature gradient required for SSE measurements is generated by two independently heated copper blocks or AlN ceramics, respectively. The longitudinal SSE signal of sample C is obtained by recording V_t as a function of the in-plane orientation of the external magnetic field α at a fixed magnetic field magnitude of 2 T. Here the temperature gradient across the GdIG/Pt interface is generated by driving a large current I_d along the Pt microstructure. The temperature-dependent resistance of the Pt is exploited for on-chip thermometry.