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. 2016 Feb 8;6:20285. doi: 10.1038/srep20285

Figure 4.

Figure 4

(a) Combined STM-top/AFM-bottom measurements of graphene/O/Ru(0001). Here the scanning mode was changed on-the-fly in the middle of the scan area. Scanning parameters: Inline graphic, Inline graphic V, Inline graphic pA, Inline graphic Hz. (b) AFM image of graphene/O/Ru(0001). Scanning parameters: Inline graphic, Inline graphic V, Inline graphic Hz. (c) Height profiles A-A’ and B-B’, extracted from (a,b), respectively.