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. 2016 Feb 15;6:20904. doi: 10.1038/srep20904

Figure 2. AFM characterization of exfoliated NiPS3.

Figure 2

(a,b) Tapping-mode AFM topography image of ultrathin NiPS3 sheets, (a) 3–8 layers indicated, (b) 1 and 2 layers indicated. Insets: corresponding optical photographs. (c) Height profiles along the lines shown in (a,b). (d) Apparent layer heights evaluated from the AFM scans in (a,b), from 1 to 8 layers. Step heights between consecutive layers are ~0.6 nm, base height offset with respect to bare Si/SiO2 substrate is ~0.8 nm.