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. 2016 Feb 15;6:21036. doi: 10.1038/srep21036

Figure 2. Characterization of the Michelson interferometer with the path length scanner.

Figure 2

(a) Series of continuous-wave interferograms produced by the rapid-scanning retro-reflective optical path length scanner. The insets show enlarged views of interferograms. (b) Time-varying path length difference between the interferometer arms produced by the rapid-scanning retro-reflective optical path length scanner. The path length difference is obtained by enumerating the zero-crossing points in one of the continuous-wave interferograms shown in Fig. 2a. The nonlinear relation between the path length difference and time is corrected by an external clock timed by the zero-crossings.