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. Author manuscript; available in PMC: 2017 Jan 1.
Published in final edited form as: Adv Mater. 2015 Jul 1;27(30):4481–4486. doi: 10.1002/adma.201501156

Figure 3.

Figure 3

a) A schematic of the Schottky diodes used for the DLCP measurements. b) DLCP measurement of the density of states of EDT-treated PbS films with and without the BQ treatment. The low-frequency regime (red box) includes contributions from carriers interacting with conductive and trap states, while the high-frequency regime (green box) gives the density of conductive states only.