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. 2016 Feb 18;6:21273. doi: 10.1038/srep21273

Figure 5. Atomic-resolution ADF STEM image and the Fourier spectrum obtained from few-layer graphene.

Figure 5

Atomic-resolution (a) HAADF and (b) LAADF STEM images obtained from twisted few-layer graphene. (c) DFT spectrum obtained from the LAADF image. We have used a Hanning window to remove any artifacts from the discontinuous image boundary condition. (d) High-magnification LAADF STEM image of the marked area in (b). A simulated LAADF STEM image, with twisted four-layer graphene (AB-stacking) with ∑(6,7) = 127, is overlaid on the left of (d). (e) Model of the four-layer structure used in the image simulation of (d). The top (pink) and bottom (cyan) two-layers have AB stacking order, but the top-layers (noted by A′,B′) are rotated θ = 5.09° relative to the bottom two layers (noted by A,B). (f) The matching candidate as functions of (m, n), plotted in the same manner as Fig. 2(d).