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. 2016 Feb 19;11(2):e0145236. doi: 10.1371/journal.pone.0145236

Fig 7. Effect of FA on morphological ultrastructure of tight junction induced by heat stress.

Fig 7

Ultrastructure of TJs in IEC-6 monolayers cell was observed with a transmission electron microscope. (A) Control group. (B) Heat stress group. (C) 5 μM FA-pretreated heat stress group. (D) 10 μM FA-pretreated heat stress group. (E) 20 μM FA-pretreated heat stress group. Arrows indicate the location of the TJs (Scale bar = 0.5 μm).