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. 2016 Feb 29;6:22330. doi: 10.1038/srep22330

Figure 1.

Figure 1

(A) Observed (red crosses) and fitted (olivine lines) synchrotron X-ray diffraction pattern of the synthesized bulk polycrystalline niobium nitride specimen for the present magnetization and electrical resistivity measurements. The peak positions of the hexagonal ε-NbN (PDF: #89-4757) and cubic δ-NbN (PDF: #74-1218) structures are denoted by tick marks. (B) SEM image showing the microstructure of the synthesized polycrystalline hexagonal-structured ε-NbN for the current measurements. The synthetic specimen was free of visible microcracks with an average grain size of about 1 μm, exhibiting an equilibrated microstructure with homogeneous fine grains. (C) High resolution TEM (HRTEM) of the synthesized specimen; the corresponding observed and simulated SAED patterns and the enlarged portion of the HRTEM image are displayed as insets. (D) Crystal structure of the hexagonal ε-NbN (P63/mmc, No. 194). The blue large and red small spheres represent Nb and N atoms, respectively.