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. 2016 Mar 1;6:22358. doi: 10.1038/srep22358

Figure 1. Scanning electron micrographs (SEM) of the silk fibers.

Figure 1

Images are pseudocolored for clarity. Part (a) shows debris on fiber surface. The largest debris particles are on the order of several µm in diameter. Part (b) shows a length of fiber which has been twisted torsionally about its axis.