Figure 2. MOSS and XRD analysis of SDC films grown on NGO and MgO and LAO.

(a) Stress-thickness product, evaluated using the Stoney equation and the elastic properties of the substrates⁵⁷,⁵⁸,⁵⁹, as a function of thickness. A positive (negative) stress value indicates an in-plane tensile (compressive) stress for the film. ɛ is the lattice mismatch (Table 1). (b) ω/2θ scans. *indicates the substrate peak and X is an instrumental artefact (K_β reflection of substrate). (c) Magnification of the region around the (002) diffraction peak of SDC. The dashed line indicates the angular position for the fully relaxed SDC structure. The peak shifts are in accordance with the sign of the stress-thickness product.