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. 2016 Feb 25;7:10692. doi: 10.1038/ncomms10692

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Low-magnification cross-sectional HAADF-STEM image of (a) ∼21-nm-thick SDC film on MgO-BS and (b) ∼32-nm-thick SDC film on MgO. Scale bars correspond to 50 nm (a), 50 nm (b), 5 nm (c), 5 nm (d). Bright-field high-resolution STEM image of the SDC film on MgO-BS (c) and on MgO (d). One of the local defects (tilted grains) is shown in d together with the positions, marked with arrowheads, of some interfacial misfit dislocation at the SDC/MgO interface. The TEM micrographs were acquired along [010] direction of MgO.