Fig. S4.
(A–C) SEM snapshots demonstrating the focused ion beam lift-out method. The FIB is used to mill out a rectangular sample and a Pt deposition needle is used to attach to the tungsten micromanipulator for lift-out. This technique can be used to prepare (D) bending samples, (E) nanoindentation samples, and (F) TEM lamella from the frustule shell. Dimensions of the beam sample are shown in D. The gauge length of the beam is 2L and the height of beam is h. Thickness of the cribrum layer, wc, and basal layer, wb, are also shown.