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. 2016 Feb 5;7:197–208. doi: 10.3762/bjnano.7.18

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Copyright © 2016, Guzmán et al.

This is an Open Access article under the terms of the Creative Commons Attribution License (https://creativecommons.org/licenses/by/2.0), which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

The license is subject to the Beilstein Journal of Nanotechnology terms and conditions: (https://www.beilstein-journals.org/bjnano/terms)

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(a) Dependence on the salt concentration of the atomic fraction of nitrogen in (PDADMAC + PSS)_N films, obtained by XPS measurement at different angles of electron emission: (squares) −40°, (circles) −30°, (upward triangles) −20°, (downward triangles) −10°, (diamonds) 0°, (leftward triangles) 10°. The solid lines are to guide the eye. (b) Dependence on the salt concentration of the atomic fraction of sulfur in (PDADMAC + PSS)_N films, obtained by XPS measurement at different angles of electron emission: (squares) −40°, (circles) −30°, (upward triangles) −20°, (downward triangles) −10°, (diamonds) 0°, (leftward triangles) 10°. The solid lines are to guide the eye. (c): Dependence on the salt concentration for the ratio between positive and negative charges in (PDADMAC + PSS)_N films, obtained by XPS measurement at normal angle of incidence and 0° emission angle. The solid line is to guide the eye.