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. 2016 Feb 5;7:197–208. doi: 10.3762/bjnano.7.18

Table 1.

Roughness for (PDADMAC + PSS)N multilayers at different ionic strengths (dry films).

cNaCl [M] N roughness [nm] technique

0.10 3 6 ± 2 X-ray reflectivity
6 3.8 ± 0.5 AFM
6 6 ± 1 X-ray reflectivity
9 4 ± 1 X-ray reflectivity
12 5 ± 1 X-ray reflectivity
15 7.8 ± 0.5 AFM
15 6 ± 2 X-ray reflectivity

0.50 12 12.1 ± 0.5 neutron reflectivity

1.00 7 17.8 ± 0.5 AFM