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. 2016 Feb 17;72(Pt 3):350–354. doi: 10.1107/S2056989016002516

Table 2. Experimental details.

  (I) (II) (III) (IV)
Crystal data
Chemical formula C26H26N2S C24H26N2O2S C22H20F2N2S C22H20Cl2N2S
M r 398.55 406.53 382.46 415.36
Crystal system, space group Triclinic, P1 Monoclinic, C2 Orthorhombic, P21212 Orthorhombic, P21212
Temperature (K) 298 298 298 298
a, b, c (Å) 5.9093 (4), 7.6258 (5), 12.6570 (8) 25.3917 (13), 5.9488 (3), 7.5623 (4) 21.1153 (16), 7.7846 (6), 6.1343 (5) 21.893 (2), 7.9212 (6), 6.2315 (4)
α, β, γ (°) 87.802 (5), 78.329 (5), 87.427 (5) 90, 97.174 (4), 90 90, 90, 90 90, 90, 90
V3) 557.76 (6) 1133.34 (10) 1008.32 (14) 1080.66 (15)
Z 1 2 2 2
Radiation type Mo Kα Mo Kα Mo Kα Mo Kα
μ (mm−1) 0.16 0.16 0.19 0.41
Crystal size (mm) 0.34 × 0.12 × 0.06 0.45 × 0.33 × 0.12 0.89 × 0.47 × 0.33 0.52 × 0.40 × 0.07
 
Data collection
Diffractometer Agilent Xcalibur (Atlas, Gemini) Agilent Xcalibur (Atlas, Gemini) Agilent Xcalibur (Atlas, Gemini) Agilent Xcalibur (Atlas, Gemini)
Absorption correction Analytical CrysAlis PRO, (Agilent, 2013) Analytical (CrysAlis PRO; Agilent, 2013) Analytical CrysAlis PRO, (Agilent, 2013) Multi-scan CrysAlis PRO, (Agilent, 2013)
T min, T max 0.969, 0.992 0.973, 0.993 0.904, 0.958 0.692, 1.000
No. of measured, independent and observed [I > 2σ(I)] reflections 6689, 4036, 2958 6341, 2221, 1892 12336, 2067, 1591 14195, 2743, 1534
R int 0.040 0.027 0.058 0.058
(sin θ/λ)max−1) 0.618 0.618 0.625 0.692
 
Refinement
R[F 2 > 2σ(F 2)], wR(F 2), S 0.058, 0.127, 1.02 0.036, 0.085, 1.02 0.044, 0.092, 1.06 0.052, 0.117, 1.01
No. of reflections 4036 2221 2067 2743
No. of parameters 262 134 124 124
No. of restraints 3 1 0 0
H-atom treatment H-atom parameters constrained H-atom parameters constrained H-atom parameters constrained H-atom parameters constrained
Δρmax, Δρmin (e Å−3) 0.31, −0.19 0.11, −0.17 0.15, −0.25 0.13, −0.17
Absolute structure Flack x determined using 962 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013) Flack x determined using 708 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013) Flack x determined using 518 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013) Flack x determined using 465 quotients [(I +)−(I )]/[(I +)+(I )] (Parsons et al., 2013)
Absolute structure parameter −0.12 (7) −0.02 (4) 0.07 (6) 0.10 (6)

Computer programs: CrysAlis PRO (Agilent, 2013), SHELXS97 (Sheldrick, 2008), SHELXT (Sheldrick, 2015a ), SHELXL2014 (Sheldrick, 2015b ) and Mercury (Macrae et al., 2008).