Table 4.

Comparative summary of DLS and TRPS size measurements for tested ENM. Reproduced in parts with permission from Pal et al. ACS Nano, 2014, 8 (9), pp 9003–9015.

ENM Type	Dynamic Light Scattering (DLS)		Tunable Resistive Pulse Sensing (TRPS)			DLS/TRPS Ratio of mean peak sizes
	Mean Size (nm)	PdI	Mean, Small Peak (nm)	Mean, Large Peak (nm)	Large peak, % of total number
SWCNH-ox	261.4±3.0	0.23	248.9	660.0	0.156	1.05
N110	282.97±3.2	0.27	202.4	-	-	1.39
Printex-90	270.37±8.2	0.37	263.7	1067.8	0.029	1.02
TiO2 P25	301.00±8.7	0.29	305.5	1042.6	0.013	0.98
CeO2	265.45±1.9	0.31	267.7	1065.8	0.014	0.99
Ni Inco	233.90±6.9	0.40	267.9	1135.8	0.010	0.87
MnOx PALAS	264.33±0.2	0.23	258.6	1077.7	0.010	1.02
nAg	183.33±6.0	0.34	285.7	1054.8	0.010	0.64