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. 2016 Mar 9;6:22832. doi: 10.1038/srep22832

Figure 1.

Figure 1

(A) SEM surface images of PEEK × 200; (B) n-HA/PEEK × 200; (C) XRD patterns of PEEK (the upper one) and n-HA/PEEK (the lower one) surfaces; (D) Fourier transform infrared scan of n-HA/PEEK.